Sunday, July 12, 2009

CEED Exam

About CEED:

CEED (Common Entrance Examination for Design) is an all India examination conducted by the Indian Institute of Technology, Bombay (IIT, Bombay), on behalf of the Ministry of Human Resources Development, Department of Education, Government of India. The examination tests the candidates for visual perception ability, drawing skills, design aptitude and communication skills.

CEED is a qualifying examination for admission to Post Graduate M.Des. programmes at the Industrial Design Centre, IIT Bombay; IDDC, IIT Delhi; CPMD, IISc Bangalore; design Programme, IIT Kanpur.

STRUCTURE OF THE EXAMINATION

The duration of the CEED exam is three hours consisting of two parts.
PART A
Visual Perception and Creative Ability Test to judge Visual sensitivity and imagination.
PART B
- Written Communication
- Ability to express precisely one's thoughts on a given topic.
- Ability to comprehend a given passage in English and summarize it

DESIGN APTITUDE

Development of new product/ visual concepts and creative ideas based on analytical observation of problems from daily life situations. Choice of product concepts suitable for small and large scale production. Generation of solution in a given material and process such as sheet metal work wood fabrication, plastic moulding, wire fabrication, etc. or representations of visual concepts into visual symbols and form, aided with drawings and illustrations. Drawings based on your analysis.

DRAWING SKILLS

Imagination of objects, people and places from our immediate or distant environments.

GATE

Syllabus for Electronics And Communication Engineering

ENGINEERING MATHEMATICS

Linear Algebra: Matrix Algebra, Systems of linear equations, Eigen values and eigen vectors.

Calculus: Mean value theorems, Theorems of integral calculus, Evaluation of definite and improper integrals, Partial Derivatives, Maxima and minima, Multiple integrals, Fourier series. Vector identities, Directional derivatives, Line, Surface and Volume integrals, Stokes, Gauss and Green’s theorems.

Differential equations: First order equation (linear and nonlinear), Higher order linear differential equations with constant coefficients, Method of variation of parameters, Cauchy’s and Euler’s equations, Initial and boundary value problems, Partial Differential Equations and variable separable method.

Complex variables: Analytic functions, Cauchy’s integral theorem and integral formula, Taylor’s and Laurent’ series, Residue theorem, solution integrals.

Probability and Statistics: Sampling theorems, Conditional probability, Mean, median, mode and standard deviation, Random variables, Discrete and continuous distributions, Poisson, Normal and Binomial distribution, Correlation and regression analysis.

Numerical Methods: Solutions of non-linear algebraic equations, single and multi-step methods for differential equations.

Transform Theory: Fourier transform, Laplace transform, Z-transform.

ELECTRONICS AND COMMUNICATION ENGINEERING

Networks: Network graphs: matrices associated with graphs; incidence, fundamental cut set and fundamental circuit matrices. Solution methods: nodal and mesh analysis. Network theorems: superposition, Thevenin and Norton’s maximum power transfer, Wye-Delta transformation. Steady state sinusoidal analysis using phasors. Linear constant coefficient differential equations; time domain analysis of simple RLC circuits, Solution of network equations using Laplace transform: frequency domain analysis of RLC circuits. 2-port network parameters: driving point and transfer functions. State equations for networks.

Electronic Devices: Energy bands in silicon, intrinsic and extrinsic silicon. Carrier transport in silicon: diffusion current, drift current, mobility, and resistivity. Generation and recombination of carriers. p-n junction diode, Zener diode, tunnel diode, BJT, JFET, MOS capacitor, MOSFET, LED, p-I-n and avalanche photo diode, Basics of LASERs. Device technology: integrated circuits fabrication process, oxidation, diffusion, ion implantation, photolithography, n-tub, p-tub and twintub CMOS process.

Analog Circuits: Small Signal Equivalent circuits of diodes, BJTs, MOSFETs and analog CMOS. Simple diode circuits, clipping, clamping, rectifier. Biasing and bias stability of transistor and FET amplifiers. Amplifiers: single-and multi-stage, differential and operational, feedback, and power. Frequency response of amplifiers. Simple op-amp circuits. Filters. Sinusoidal oscillators; criterion for oscillation; single-transistor and op-amp configurations. Function generators and waveshaping circuits, 555 Timers. Power supplies.

Digital circuits: Boolean algebra, minimization of Boolean functions; logic gates; digital IC families (DTL, TTL, ECL, MOS, CMOS). Combinatorial circuits: arithmetic circuits, code converters, multiplexers, decoders, PROMs and PLAs. Sequential circuits: latches and flip-flops, counters and shift-registers. Sample and hold circuits, ADCs, DACs. Semiconductor memories. Microprocessor(8085): architecture, programming, memory and I/O interfacing.

Signals and Systems: Definitions and properties of Laplace transform, continuous-time and discrete-time Fourier series, continuous-time and discrete-time Fourier Transform, DFT and FFT, z-transform. Sampling theorem. Linear Time-Invariant (LTI) Systems: definitions and properties; causality, stability, impulse response, convolution, poles and zeros, parallel and cascade structure, frequency response, group delay, phase delay. Signal transmission through LTI systems.

Control Systems: Basic control system components; block diagrammatic description, reduction of block diagrams. Open loop and closed loop (feedback) systems and stability analysis of these systems. Signal flow graphs and their use in determining transfer functions of systems; transient and steady state analysis of LTI control systems and frequency response. Tools and techniques for LTI control system analysis: root loci, Routh-Hurwitz criterion, Bode and Nyquist plots. Control system compensators: elements of lead and lag compensation, elements of Proportional-Integral- Derivative (PID) control. State variable representation and solution of state equation of LTI control systems.

Communications: Random signals and noise: probability, random variables, probability density function, autocorrelation, power spectral density. Analog communication systems: amplitude and angle modulation and demodulation systems, spectral analysis of these operations, superheterodyne receivers; elements of hardware, realizations of analog communication systems; signal-to-noise ratio (SNR) calculations for amplitude modulation (AM) and frequency modulation (FM) for low noise conditions. Fundamentals of information theory and channel capacity theorem. Digital communication systems: pulse code modulation (PCM), differential pulse code modulation (DPCM), digital modulation schemes: amplitude, phase and frequency shift keying schemes (ASK, PSK, FSK), matched filter receivers, bandwidth consideration and probability of error calculations for these schemes. Basics of TDMA, FDMA and CDMA and GSM.

Electromagnetics: Elements of vector calculus: divergence and curl; Gauss’ and Stokes’ theorems, Maxwell’s equations: differential and integral forms. Wave equation, Poynting vector. Plane waves: propagation through various media; reflection and refraction; phase and group velocity; skin depth. Transmission lines: characteristic impedance; impedance transformation; Smith chart; impedance matching; S parameters, pulse excitation. Waveguides: modes in rectangular waveguides; boundary conditions; cut-off frequencies; dispersion relations. Basics of propagation in dielectric waveguide and optical fibers. Basics of Antennas: Dipole antennas; radiation pattern; antenna gain.

Monday, March 23, 2009

Competitive Examinations in India after graduation

Competitive Examinations in India

UPSC Competitive Exams

Central Police Forces (Assistant Commandants Examination)
Civil Services (I.A.S.) Exam
Combined Defence Services (C.D.S.)Exam
Combined Medical Services (C.M.S) Exam
Combined Engineering Services Exam
Geologists Exam
Indian Economic/Statistical Services Exam
Indian Forest Service (IFS) Exam
National Defence Academy (N.D.A.) Exam
Section Officers/ Stenographers (Grade ‘B’/Grade-I) Limited Departmental Competitive Examination

SSC Competitive Exams
Assistants Grade Exam
Clerks Grade Exam
Combined Graduate Preliminary Exam
Combined Matric Preliminary Exam
Divisional Accountants /Auditors/UDC Exam
Income Tax/ Excise Inspectors, etc.. Exam
Stenographers' Grade 'C' Exam
Stenographers' Grade 'D' Exam

Defence Competitive Exams
Combined Defence Services (C.D.S.) Exam (UPSC)
National Defence Academy (N.D.A.) Exam (UPSC)
I.A.F. Airman (Technical Trades) Exam
I.A.F. Airman (Non-Technical Trades) Exam
I.A.F. Airman (Educational Instructors Trade) Exam
Indian Navy Sailors Matric Entry Recruitment Exam
Indian Navy Artificer Apprentices Exam
Indian Navy Dockyard Apprentices Exam
Indian Army Soldiers (Technical) M.E.R. Exam
Indian Army Soldiers Nursing Assistant's M.E.R. Exam
Indian Army Soldiers General Duty (NER) Exam
Indian Army Soldiers Clerks Exam

L.I.C/ G. I.C Competitive Exams
L.I.C Officers' Exam
G.I.C Officers' Exam
L.I.C Development Officers' Exam
G.I.C. Assistants Exam

Bank Competitive Exam
State Bank Probationary Officers Exam
Reserve Bank Grade 'A' / 'B' Officers' Exam

Railway Competitive Exam

Special Class Railway Apprentices Exam (UPSC)

University Grants Commission (UGC)

National Eligibility Test (NET)

XAT (Xavier Admission Test)

The XAT is conducted for admission to Post-Graduate degree programmes in Management at XLRI, XIM, XISS, LIBA etc. The XLRI is ranked amongst the top 5 B-Schools in India and XIM Bhubaneshwar is ranked among the top 20 management institutes in India.

The Xavier Labour Relations Institute (XLRI), Jamshedpur conducts the Xavier Admission Test (XAT). The advertisement for form appears in late August. The entrance exam is usually held on the first Sunday of January and the Interviews are in the month of March.

The XAT is a two-hour duration paper, with number of questions being 200. The paper divided into 3 sections with sectional timings being enforced.

The method of scoring is:
Right Answer: 1 mark & Incorrect Answer: -1/3 mark.

Section

No. Of Questions

English

80

Reasoning & Quantitative Ability

60

General Awareness

60

In the last 20-min you are expected to write a 250 – 300 word essay with topics ranging from those of social relevance to propositions to abstract.

Registration for XAT

To register for XAT, candidates have to fill the XAT Form that is available online at www.xlri.edu/xat. Once the candidate logs on to this site, a full set of instructions will appear and following them, the candidate can obtain his/her ID and password.

This ID and password are to be indicated for all the future correspondence with XAT Office, Jamshedpur. For writing the XAT, the candidates should select their convenient cities from the list of city-choices available on the web site.


JMET (Joint Management Entrance Test)

The Joint Management Entrance Test (JMET) is the first step for admission to Post Graduate degree programmes in Management at the IITs (Indian Institutes of Technology) and the IISc (Indian Institute of Science, Bangalore).

Currently IISc Bangalore, IIT Bombay, IIT Delhi, IIT Kanpur, IIT Kharagpur, IIT Madras and IIT Roorkee offer such Programmes in Management.

Students have to apply for JMET and send separate application forms to different IITs and IISc as per their choice.The IITs and IISc will use the results of JMET to short list candidates for the subsequent part of the selection process.

The JMET is usually conducted on the 2nd Sunday of every December and has many test centres all over India. The application deadline is usually in the third week of October and the forms are available at the GATE offices of the institutes as well as online on the websites of the institutes.